Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology

Alireza  Mohammad Zaki; Yutong Du; Stoyan Nihtianova

doi:10.1109/ET59121.2023.10278935

Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology

Alireza Mohammad Zaki, Yutong Du, Stoyan Nihtianova

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (SciVal)

54 Downloads (Pure)

Abstract

This paper presents the design methodology, test setup and experimental qualification results of a high-speed low-power threshold comparator in 40 nm CMOS technology intended for the registry of particles landing on a PIN-detector surface in particle detector readout electronics. The operation of the designed comparator is experimentally qualified for ideal digital pulses and analog signals generated by the preceding stages in a targeted potential application.

Original language	English
Title of host publication	2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Electronic)	979-8-3503-0200-4
ISBN (Print)	979-8-3503-0201-1
DOIs	https://doi.org/10.1109/ET59121.2023.10278935
Publication status	Published - 2023
Event	2023 XXXII International Scientific Conference Electronics (ET) - Sozopol, Bulgaria Duration: 13 Sept 2023 → 15 Sept 2023

Publication series

Name	2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings

Conference

Conference	2023 XXXII International Scientific Conference Electronics (ET)
Country/Territory	Bulgaria
City	Sozopol
Period	13/09/23 → 15/09/23

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

high-speed
low-power
readout interface
voltage comparator
temperature sensor

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10.1109/ET59121.2023.10278935

Design_and_Qualification_of_a_High-Speed_Low-Power_Comparator_in_40_nm_CMOS_TechnologyFinal published version, 1.27 MB

Cite this

Mohammad Zaki, A., Du, Y., & Nihtianova, S. (2023). Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology. In 2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings (pp. 1-5). (2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings). IEEE. https://doi.org/10.1109/ET59121.2023.10278935

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title = "Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology",

abstract = "This paper presents the design methodology, test setup and experimental qualification results of a high-speed low-power threshold comparator in 40 nm CMOS technology intended for the registry of particles landing on a PIN-detector surface in particle detector readout electronics. The operation of the designed comparator is experimentally qualified for ideal digital pulses and analog signals generated by the preceding stages in a targeted potential application.",

keywords = "high-speed, low-power, readout interface, voltage comparator, temperature sensor",

author = "{Mohammad Zaki}, Alireza and Yutong Du and Stoyan Nihtianova",

note = "Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.; 2023 XXXII International Scientific Conference Electronics (ET) ; Conference date: 13-09-2023 Through 15-09-2023",

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Mohammad Zaki, A, Du, Y & Nihtianova, S 2023, Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology. in 2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings. 2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings, IEEE, pp. 1-5, 2023 XXXII International Scientific Conference Electronics (ET), Sozopol, Bulgaria, 13/09/23. https://doi.org/10.1109/ET59121.2023.10278935

Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology. / Mohammad Zaki, Alireza ; Du, Yutong; Nihtianova, Stoyan.
2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings. IEEE, 2023. p. 1-5 (2023 32nd International Scientific Conference Electronics, ET 2023 - Proceedings).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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N1 - Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

PY - 2023

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AB - This paper presents the design methodology, test setup and experimental qualification results of a high-speed low-power threshold comparator in 40 nm CMOS technology intended for the registry of particles landing on a PIN-detector surface in particle detector readout electronics. The operation of the designed comparator is experimentally qualified for ideal digital pulses and analog signals generated by the preceding stages in a targeted potential application.

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KW - low-power

KW - readout interface

KW - voltage comparator

KW - temperature sensor

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Y2 - 13 September 2023 through 15 September 2023

ER -

Design and Qualification of a High-Speed Low-Power Comparator in 40 nm CMOS Technology

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