Design and test of integrated circuits in Nano era: what is next?

Research output: Contribution to conference › Abstract › Scientific

Original language	English
DOIs	https://doi.org/10.1109/ICSCS.2008.4746859
Publication status	Published - 2008
Event	2008 International Conference on Signals, Circuits and Systems - Monastir, Hammamet-Tunisia Duration: 7 Nov 2008 → 9 Nov 2008

Conference	2008 International Conference on Signals, Circuits and Systems
Period	7/11/08 → 9/11/08

Keywords

@conference{179765027803413d9c4b919b607d8ba3,

title = "Design and test of integrated circuits in Nano era: what is next?",

keywords = "Geen BTA classificatie",

author = "S Hamdioui",

year = "2008",

doi = "10.1109/ICSCS.2008.4746859",

language = "English",

note = "2008 International Conference on Signals, Circuits and Systems ; Conference date: 07-11-2008 Through 09-11-2008",

}