Design dependent SRAM PUF robustness analysis

AMMO Cortez; S Hamdioui; R Ishihara

doi:10.1109/LATW.2015.7102498

Design dependent SRAM PUF robustness analysis

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	English
Title of host publication	Proceedings - 16th IEEE Latin-American Test Symposium
Editors	V Champac, Y Zorian
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	1-6
Number of pages	6
ISBN (Print)	9781467367110
DOIs	https://doi.org/10.1109/LATW.2015.7102498
Publication status	Published - 2015
Event	LATS 2015 - Puerto Vallarta, Mexico Duration: 25 Mar 2015 → 27 Mar 2015

Publication series

Name
Publisher	IEEE

Conference

Conference	LATS 2015
Country/Territory	Mexico
City	Puerto Vallarta
Period	25/03/15 → 27/03/15

Bibliographical note

Harvest

Access to Document

10.1109/LATW.2015.7102498

Cite this

@inproceedings{222e4a5854dc42f699712967e2e916b7,

title = "Design dependent SRAM PUF robustness analysis",

author = "AMMO Cortez and S Hamdioui and R Ishihara",

note = "Harvest; LATS 2015 ; Conference date: 25-03-2015 Through 27-03-2015",

year = "2015",

doi = "10.1109/LATW.2015.7102498",

language = "English",

isbn = "9781467367110",

publisher = "IEEE",

pages = "1--6",

editor = "V Champac and Y Zorian",

booktitle = "Proceedings - 16th IEEE Latin-American Test Symposium",

address = "United States",

}

TY - GEN

T1 - Design dependent SRAM PUF robustness analysis

AU - Cortez, AMMO

AU - Hamdioui, S

AU - Ishihara, R

N1 - Harvest

PY - 2015

Y1 - 2015

U2 - 10.1109/LATW.2015.7102498

DO - 10.1109/LATW.2015.7102498

M3 - Conference contribution

SN - 9781467367110

SP - 1

EP - 6

BT - Proceedings - 16th IEEE Latin-American Test Symposium

A2 - Champac, V

A2 - Zorian, Y

PB - IEEE

CY - Piscataway, NJ, USA

T2 - LATS 2015

Y2 - 25 March 2015 through 27 March 2015

ER -