Design dependent SRAM PUF robustness analysis

AMMO Cortez, S Hamdioui, R Ishihara

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 16th IEEE Latin-American Test Symposium
EditorsV Champac, Y Zorian
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-6
Number of pages6
ISBN (Print)9781467367110
DOIs
Publication statusPublished - 2015
EventLATS 2015 - Puerto Vallarta, Mexico
Duration: 25 Mar 201527 Mar 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceLATS 2015
CountryMexico
CityPuerto Vallarta
Period25/03/1527/03/15

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