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Design dependent SRAM PUF robustness analysis

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original languageEnglish
Title of host publicationProceedings - 16th IEEE Latin-American Test Symposium
EditorsV Champac, Y Zorian
Place of PublicationPiscataway, NJ, USA
PublisherIEEE
Pages1-6
Number of pages6
ISBN (Print)9781467367110
DOIs
Publication statusPublished - 2015
EventLATS 2015 - Puerto Vallarta, Mexico
Duration: 25 Mar 2015 → 27 Mar 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceLATS 2015
Country/TerritoryMexico
CityPuerto Vallarta
Period25/03/15 → 27/03/15

Bibliographical note

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