Design for Reliability of Wafer Level MEMS packaging

JJM Zaal

Research output: ThesisDissertation (TU Delft)

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
  • Zhang, G.Q., Supervisor
  • van Driel, W.D., Advisor
  • Lee, SWR, Advisor, External person
  • Schmitz, J, Advisor, External person
  • Corigliano, A, Advisor, External person
  • Ferreira, J.A., Advisor
  • Ernst, Leo, Advisor
Award date29 Oct 2012
Place of PublicationEnschede
Print ISBNs9789491104114
Publication statusPublished - 2012


  • authored books
  • Diss. prom. aan TU Delft

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