Designing a memory module tester

DP van der Velde, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	Undefined/Unknown
Title of host publication	Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing
Editors	R Rajsuman, T Wik
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	91-98
Number of pages	8
ISBN (Print)	0-7695-0259-8
Publication status	Published - 1999
Event	1999 IEEE International Workshop on Memory Technology, Design and Testing, San Jose - Los Alamitos Duration: 9 Aug 1999 → 10 Aug 1999

Name
Publisher	IEEE Computer Society

Conference	1999 IEEE International Workshop on Memory Technology, Design and Testing, San Jose
Period	9/08/99 → 10/08/99

Keywords

@inproceedings{ed06e666f3ef447ea7db3650bc86f8af,

title = "Designing a memory module tester",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van der Velde}, DP and {van de Goor Ph D}, AJ",

year = "1999",

language = "Undefined/Unknown",

isbn = "0-7695-0259-8",

publisher = "IEEE",

pages = "91--98",

editor = "{R Rajsuman} and {T Wik}",

booktitle = "Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing",

address = "United States",

note = "1999 IEEE International Workshop on Memory Technology, Design and Testing, San Jose ; Conference date: 09-08-1999 Through 10-08-1999",

}

TY - GEN

T1 - Designing a memory module tester

AU - van der Velde, DP

AU - van de Goor Ph D, AJ

PY - 1999

Y1 - 1999

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-0259-8

SP - 91

EP - 98

BT - Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing

A2 - R Rajsuman, null

A2 - T Wik, null

PB - IEEE

CY - Los Alamitos

T2 - 1999 IEEE International Workshop on Memory Technology, Design and Testing, San Jose

Y2 - 9 August 1999 through 10 August 1999

ER -