Designing a memory module tester

DP van der Velde, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationRecords of the 1999 IEEE International Workshop on Memory Technology, Design and Testing
Editors R Rajsuman, T Wik
Place of PublicationLos Alamitos
PublisherIEEE
Pages91-98
Number of pages8
ISBN (Print)0-7695-0259-8
Publication statusPublished - 1999
Event1999 IEEE International Workshop on Memory Technology, Design and Testing, San Jose - Los Alamitos
Duration: 9 Aug 199910 Aug 1999

Publication series

Name
PublisherIEEE Computer Society

Conference

Conference1999 IEEE International Workshop on Memory Technology, Design and Testing, San Jose
Period9/08/9910/08/99

Keywords

  • ZX Int.klas.verslagjaar < 2002

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