Detecting memory faults in the presence of bit line coupling in SRAM devices

IS Irobi, Z Al-Ars, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

7 Citations (Scopus)
Original languageEnglish
Title of host publicationIntl. test conference 2010
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-10
Number of pages10
ISBN (Print)978-1-4244-7207-9
Publication statusPublished - 2010
EventITC 2010 - Piscataway
Duration: 31 Oct 20105 Nov 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceITC 2010
Period31/10/105/11/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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