Fingerprint
Dive into the research topics of 'Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs
G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
1
Citation
(Scopus)
88
Downloads
(Pure)