Detecting unique faults in multi-port SRAMs

S Hamdioui, AJ van de Goor, D Eastwick, M Rodgers

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings
Editors	DC Young
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	37-42
Number of pages	6
ISBN (Print)	0-7695-1378-6
Publication status	Published - 2001
Event	10th Asian Test Symposium, Kyoto - Los Alamitos Duration: 19 Nov 2001 → 21 Nov 2001

Name
Publisher	IEEE Computer Society

Conference	10th Asian Test Symposium, Kyoto
Period	19/11/01 → 21/11/01

Keywords

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title = "Detecting unique faults in multi-port SRAMs",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "S Hamdioui and {van de Goor}, AJ and D Eastwick and M Rodgers",

year = "2001",

language = "Undefined/Unknown",

isbn = "0-7695-1378-6",

publisher = "IEEE",

pages = "37--42",

editor = "{DC Young}",

booktitle = "Proceedings",

address = "United States",

note = "10th Asian Test Symposium, Kyoto ; Conference date: 19-11-2001 Through 21-11-2001",

}

TY - GEN

T1 - Detecting unique faults in multi-port SRAMs

AU - Hamdioui, S

AU - van de Goor, AJ

AU - Eastwick, D

AU - Rodgers, M

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-1378-6

SP - 37

EP - 42

BT - Proceedings

A2 - DC Young, null

PB - IEEE

CY - Los Alamitos

T2 - 10th Asian Test Symposium, Kyoto

Y2 - 19 November 2001 through 21 November 2001

ER -