Detection of thermal runaway and extraction of thermal resistance in silicon-on-glass NPN BJTs using the Vcb-Vbe voltage plane

V d'Alessandro; N Nenadovic; F Tamigi; LK Nanver; H Schellevis; JW Slotboom

Detection of thermal runaway and extraction of thermal resistance in silicon-on-glass NPN BJTs using the Vcb-Vbe voltage plane

V d'Alessandro, N Nenadovic, F Tamigi, LK Nanver, H Schellevis, JW Slotboom

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	22-29
Number of pages	8
ISBN (Print)	90-73461-33-2
Publication status	Published - 2002
Event	SAFE, Veldhoven, NL - Utrecht Duration: 27 Nov 2002 → 28 Nov 2002

Publication series

Name
Publisher	STW Technology Foundation

Conference

Conference	SAFE, Veldhoven, NL
Period	27/11/02 → 28/11/02

Bibliographical note

CD-ROM

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{6da4e7d1d44846bbb54b33705fdfcb63,

title = "Detection of thermal runaway and extraction of thermal resistance in silicon-on-glass NPN BJTs using the Vcb-Vbe voltage plane",

keywords = "Conf.proc. > 3 pag",

author = "V d'Alessandro and N Nenadovic and F Tamigi and LK Nanver and H Schellevis and JW Slotboom",

note = "CD-ROM; SAFE, Veldhoven, NL ; Conference date: 27-11-2002 Through 28-11-2002",

year = "2002",

language = "Undefined/Unknown",

isbn = "90-73461-33-2",

publisher = "STW Technology Foundation",

pages = "22--29",

booktitle = "SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop",

}

d'Alessandro, V, Nenadovic, N, Tamigi, F, Nanver, LK, Schellevis, H & Slotboom, JW 2002, Detection of thermal runaway and extraction of thermal resistance in silicon-on-glass NPN BJTs using the Vcb-Vbe voltage plane. in SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop. STW Technology Foundation, Utrecht, pp. 22-29, SAFE, Veldhoven, NL, 27/11/02.

Detection of thermal runaway and extraction of thermal resistance in silicon-on-glass NPN BJTs using the Vcb-Vbe voltage plane. / d'Alessandro, V; Nenadovic, N; Tamigi, F et al.
SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop. Utrecht: STW Technology Foundation, 2002. p. 22-29.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Detection of thermal runaway and extraction of thermal resistance in silicon-on-glass NPN BJTs using the Vcb-Vbe voltage plane

AU - d'Alessandro, V

AU - Nenadovic, N

AU - Tamigi, F

AU - Nanver, LK

AU - Schellevis, H

AU - Slotboom, JW

N1 - CD-ROM

PY - 2002

Y1 - 2002

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 90-73461-33-2

SP - 22

EP - 29

BT - SAFE 2002 Proceedings of 5th Semiconductor Advances for Future Electronics Workshop

PB - STW Technology Foundation

CY - Utrecht

T2 - SAFE, Veldhoven, NL

Y2 - 27 November 2002 through 28 November 2002

ER -