Determination of absolute configurations of crystal structures using electron diffraction patterns by means of least-squares refinement

J Jansen, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    11 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)291-300
    Number of pages10
    JournalUltramicroscopy
    Volume90
    Publication statusPublished - 2002

    Keywords

    • ZX CWTS 1.00 <= JFIS < 3.00

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