Determination of Polarity of GaN Cross-section TEM Specimens Using Quantitative Electron Diffraction.

HW Zandbergen, J Jansen, ARA Zauner, JL Weyher

Research output: Contribution to journal › Article › Scientific › peer-review

ISSN 0022-0248

Keywords

@article{a25bd8a2d4074bacac42f8395d3c0c96,

title = "Determination of Polarity of GaN Cross-section TEM Specimens Using Quantitative Electron Diffraction.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "HW Zandbergen and J Jansen and ARA Zauner and JL Weyher",

note = "ISSN 0022-0248",

year = "2000",

language = "Undefined/Unknown",

volume = "210",

pages = "167--171",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

publisher = "Elsevier",

}

TY - JOUR

T1 - Determination of Polarity of GaN Cross-section TEM Specimens Using Quantitative Electron Diffraction.

AU - Zandbergen, HW

AU - Jansen, J

AU - Zauner, ARA

AU - Weyher, JL

N1 - ISSN 0022-0248

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0022-0248

VL - 210

SP - 167

EP - 171

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

ER -