Determining the decomposition voltage of Cu(In1-xGax)Se2

Klaas Bakker, Joaquin Coll Matas, Johan Bosman, Nicolas Barreau, Arthur Weeber, Mirjam Theelen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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Abstract

Partial shading of CIGS modules can lead to permanent damage of the module in the shaded area. This is caused by harmful reverse bias voltages in the shaded area which lead to reverse bias induced defects, also known as wormlike defects. A lot is already known about the origin and propagation of wormlike defects. However, the fundamental question; why is CIGS so sensitive to reverse bias damage? has not yet been answered. In this study we show that CIGS semiconductor material in the presence of an electric field will spontaneously decompose.

Original languageEnglish
Title of host publication2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages381-383
Number of pages3
ISBN (Electronic)9781728161174
DOIs
Publication statusPublished - 2022
Event49th IEEE Photovoltaics Specialists Conference, PVSC 2022 - Philadelphia, United States
Duration: 5 Jun 202210 Jun 2022

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2022-June
ISSN (Print)0160-8371

Conference

Conference49th IEEE Photovoltaics Specialists Conference, PVSC 2022
Country/TerritoryUnited States
CityPhiladelphia
Period5/06/2210/06/22

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • CIGS
  • decomposition
  • partial shading
  • reliability
  • reverse bias

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