Determining the material structure of microcrystalline silicon from Raman spectra

C Smit, RACMM Swaaij, H Donker, AMHN Petit, WMM Kessels, MCM van de Sanden

Research output: Contribution to journalArticleScientificpeer-review

284 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)3582-3588
Number of pages7
JournalJournal of Applied Physics
Volume94
Issue number5
Publication statusPublished - 2003

Keywords

  • Elektrotechniek
  • Techniek
  • ZX CWTS 1.00 <= JFIS < 3.00

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