Determining the material structure of microcrystalline silicon from Raman spectra

C Smit, RACMM Swaaij, H Donker, AMHN Petit, WMM Kessels, MCM van de Sanden

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

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@article{0031e73432d347dca9b2b4de2403a2b0,

title = "Determining the material structure of microcrystalline silicon from Raman spectra",

keywords = "Elektrotechniek, Techniek, ZX CWTS 1.00 <= JFIS < 3.00",

author = "C Smit and RACMM Swaaij and H Donker and AMHN Petit and WMM Kessels and {van de Sanden}, MCM",

year = "2003",

language = "Undefined/Unknown",

volume = "94",

pages = "3582--3588",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "AIP Publishing",

number = "5",

}

TY - JOUR

T1 - Determining the material structure of microcrystalline silicon from Raman spectra

AU - Smit, C

AU - Swaaij, RACMM

AU - Donker, H

AU - Petit, AMHN

AU - Kessels, WMM

AU - van de Sanden, MCM

PY - 2003

Y1 - 2003

KW - Elektrotechniek

KW - Techniek

KW - ZX CWTS 1.00 <= JFIS < 3.00

M3 - Article

SN - 0021-8979

VL - 94

SP - 3582

EP - 3588

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

ER -