Development and application of a portable multipurpose on-site/on-line PD measurement system

S Meijer; RGA Zoetmulder; JJ Smit; ERS Groot; MD Judd

Development and application of a portable multipurpose on-site/on-line PD measurement system

S Meijer, RGA Zoetmulder, JJ Smit, ERS Groot, MD Judd

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	IEE Conference publication 473
Place of Publication	London
Publisher	IEE
Pages	133-138
Number of pages	6
ISBN (Print)	0-85296-730-6
Publication status	Published - 2000
Event	8th International Conference on Dielectric Materials, Measurements and Applications, Edinburgh - London Duration: 17 Sept 2000 → 21 Sept 2000

Publication series

Name
Publisher	IEE

Conference

Conference	8th International Conference on Dielectric Materials, Measurements and Applications, Edinburgh
Period	17/09/00 → 21/09/00

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{c3014563ba584a46943eec0fd76fb736,

title = "Development and application of a portable multipurpose on-site/on-line PD measurement system",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "S Meijer and RGA Zoetmulder and JJ Smit and ERS Groot and MD Judd",

year = "2000",

language = "Undefined/Unknown",

isbn = "0-85296-730-6",

publisher = "IEE",

pages = "133--138",

booktitle = "IEE Conference publication 473",

note = "8th International Conference on Dielectric Materials, Measurements and Applications, Edinburgh ; Conference date: 17-09-2000 Through 21-09-2000",

}

TY - GEN

T1 - Development and application of a portable multipurpose on-site/on-line PD measurement system

AU - Meijer, S

AU - Zoetmulder, RGA

AU - Smit, JJ

AU - Groot, ERS

AU - Judd, MD

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-85296-730-6

SP - 133

EP - 138

BT - IEE Conference publication 473

PB - IEE

CY - London

T2 - 8th International Conference on Dielectric Materials, Measurements and Applications, Edinburgh

Y2 - 17 September 2000 through 21 September 2000

ER -