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Development of a high resolution topography and color scanner to capture crack patterns of paintings
M.J.W. van Hengstum, T.T.W. Essers, W.S. Elkhuizen, D. Dodou, Y. Song, J.M.P. Geraedts, J. Dik
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
5
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(Scopus)
216
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