Development of a high resolution topography and color scanner to capture crack patterns of paintings

M.J.W. van Hengstum, T.T.W. Essers, W.S. Elkhuizen, D. Dodou, Y. Song, J.M.P. Geraedts, J. Dik

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
131 Downloads (Pure)

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