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Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
2
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