Device-Aware Test for Back-Hopping Defects in STT-MRAMs

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

9 Downloads (Pure)


Dive into the research topics of 'Device-Aware Test for Back-Hopping Defects in STT-MRAMs'. Together they form a unique fingerprint.



Computer Science