Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

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Abstract

This paper introduces a new test approach: device-aware test (DAT) for emerging memory technologies such as MRAM, RRAM, and PCM. The DAT approach enables accurate models of device defects to obtain realistic fault models, which are used to develop high-quality and optimized test solutions. This is demonstrated by an application of DAT to pinhole defects in STT-MRAMs and forming defects in RRAMs.
Original languageEnglish
Title of host publication2020 IEEE European Test Symposium (ETS)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-2
Number of pages2
ISBN (Electronic) 978-1-7281-4312-5
ISBN (Print)978-1-7281-4313-2
DOIs
Publication statusPublished - 2020
EventETS 2020: 2020 IEEE European Test Symposium - Tallinn, Estonia
Duration: 25 May 202029 May 2020

Conference

ConferenceETS 2020
CountryEstonia
CityTallinn
Period25/05/2029/05/20

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  • Cite this

    Wu, L., Fieback, M., Taouil, M., & Hamdioui, S. (2020). Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. In 2020 IEEE European Test Symposium (ETS) (pp. 1-2). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ETS48528.2020.9131559