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DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs
Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
8
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(Scopus)
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