Diagnostic technologies for embedded intelligence in high voltage power equipment

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	2011 IEEE Power Energy Society General Meeting
Editors	E So
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	3826-3829
Number of pages	4
ISBN (Print)	978-1-4577-1001-8
DOIs	https://doi.org/10.1109/PES.2011.6039612
Publication status	Published - 2011
Event	2011 IEEE PES General Meeting - Piscataway, NJ, USA Duration: 24 Jul 2011 → 29 Jul 2011

Name
Publisher	IEEE

Conference	2011 IEEE PES General Meeting
Period	24/07/11 → 29/07/11

Keywords

@inproceedings{74198554626940e7b1dc10ed7dfe0c6f,

title = "Diagnostic technologies for embedded intelligence in high voltage power equipment",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "JJ Smit",

year = "2011",

doi = "10.1109/PES.2011.6039612",

language = "English",

isbn = "978-1-4577-1001-8",

publisher = "IEEE Society",

pages = "3826--3829",

editor = "E So",

booktitle = "2011 IEEE Power Energy Society General Meeting",

note = "2011 IEEE PES General Meeting ; Conference date: 24-07-2011 Through 29-07-2011",

}

TY - GEN

T1 - Diagnostic technologies for embedded intelligence in high voltage power equipment

AU - Smit, JJ

PY - 2011

Y1 - 2011

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - 10.1109/PES.2011.6039612

DO - 10.1109/PES.2011.6039612

M3 - Conference contribution

SN - 978-1-4577-1001-8

SP - 3826

EP - 3829

BT - 2011 IEEE Power Energy Society General Meeting

A2 - So, E

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 2011 IEEE PES General Meeting

Y2 - 24 July 2011 through 29 July 2011

ER -