Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation.

M Leoni, U Welzel, P Lampartner, EJ Mittemeijer, J-D Kamminga

    Research output: Contribution to journalArticleScientificpeer-review

    55 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)597-623
    Number of pages27
    JournalPhilosophical Magazine A: Physics of Condensed Matter. Defects and Mechanical Properties
    Volume81
    Publication statusPublished - 2001

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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