Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation.

M Leoni, U Welzel, P Lampartner, EJ Mittemeijer, J-D Kamminga

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	597-623
Number of pages	27
Journal	Philosophical Magazine A: Physics of Condensed Matter. Defects and Mechanical Properties
Volume	81
Publication status	Published - 2001

Keywords

@article{343d3b799a7e4e9e96f508ba9b4645ce,

title = "Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "M Leoni and U Welzel and P Lampartner and EJ Mittemeijer and J-D Kamminga",

year = "2001",

language = "Undefined/Unknown",

volume = "81",

pages = "597--623",

journal = "Philosophical Magazine A: Physics of Condensed Matter. Defects and Mechanical Properties",

issn = "0141-8610",

publisher = "Taylor & Francis",

}

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation.

AU - Leoni, M

AU - Welzel, U

AU - Lampartner, P

AU - Mittemeijer, EJ

AU - Kamminga, J-D

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0141-8610

VL - 81

SP - 597

EP - 623

JO - Philosophical Magazine A: Physics of Condensed Matter. Defects and Mechanical Properties

JF - Philosophical Magazine A: Physics of Condensed Matter. Defects and Mechanical Properties

ER -