Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallite size

JD Kamminga, LJ Seijbel

    Research output: Contribution to journalArticleScientificpeer-review

    18 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)65-74
    Number of pages10
    JournalNational Institute of Standards and Technology. Journal of Research
    Volume109
    Publication statusPublished - 2004

    Keywords

    • ZX CWTS JFIS < 1.00

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