Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallize size

J-D Kamminga, LJ Seijbel

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Journal	National Institute of Standards and Technology. Journal of Research
Volume	108
Issue number	5
Publication status	Published - 2003

Keywords

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title = "Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallize size",

keywords = "ZX CWTS JFIS < 1.00",

author = "J-D Kamminga and LJ Seijbel",

year = "2003",

language = "Undefined/Unknown",

volume = "108",

journal = "National Institute of Standards and Technology. Journal of Research",

issn = "1044-677X",

publisher = "National Institute of Standards and Technology",

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TY - JOUR

T1 - Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallize size

AU - Kamminga, J-D

AU - Seijbel, LJ

PY - 2003

Y1 - 2003

KW - ZX CWTS JFIS < 1.00

M3 - Article

SN - 1044-677X

VL - 108

JO - National Institute of Standards and Technology. Journal of Research

JF - National Institute of Standards and Technology. Journal of Research

IS - 5

ER -