Diffraction-line Broadening analysis of Strain Fields in Crystalline Solids.

JGM van Berkum, R Delhez, Th.H de Keijser, EJ Mittemeijer

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	Undefined/Unknown
Title of host publication	Defect and Microstructure Analysis by Diffraction.
Editors	RL Snyder, J Fiala, HJ Bunge
Place of Publication	Oxford, UK.
Publisher	Oxford University Press
Pages	214-233
Number of pages	20
ISBN (Print)	0198501897
Publication status	Published - 2000

Keywords

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title = "Diffraction-line Broadening analysis of Strain Fields in Crystalline Solids.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van Berkum}, JGM and R Delhez and {de Keijser}, Th.H and EJ Mittemeijer",

year = "2000",

language = "Undefined/Unknown",

isbn = "0198501897",

pages = "214--233",

editor = "RL Snyder and J Fiala and HJ Bunge",

booktitle = "Defect and Microstructure Analysis by Diffraction.",

publisher = "Oxford University Press",

address = "United Kingdom",

}

Diffraction-line Broadening analysis of Strain Fields in Crystalline Solids. / van Berkum, JGM; Delhez, R; de Keijser, Th.H et al.
Defect and Microstructure Analysis by Diffraction.. ed. / RL Snyder; J Fiala; HJ Bunge. Oxford, UK.: Oxford University Press, 2000. p. 214-233.

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

TY - CHAP

T1 - Diffraction-line Broadening analysis of Strain Fields in Crystalline Solids.

AU - van Berkum, JGM

AU - Delhez, R

AU - de Keijser, Th.H

AU - Mittemeijer, EJ

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Chapter

SN - 0198501897

SP - 214

EP - 233

BT - Defect and Microstructure Analysis by Diffraction.

A2 - Snyder, RL

A2 - Fiala, J

A2 - Bunge, HJ

PB - Oxford University Press

CY - Oxford, UK.

ER -