Diffraction stress analysis of thin films: modeling and experimental evaluation of elastic constants and grain interaction.

M van Leeuwen, J-D Kamminga, EJ Mittemeijer

Research output: Contribution to journal › Article › Scientific › peer-review

Cite this

@article{824b1de3fb754c9a85edb08e3805b789,

title = "Diffraction stress analysis of thin films: modeling and experimental evaluation of elastic constants and grain interaction.",

author = "{van Leeuwen}, M and J-D Kamminga and EJ Mittemeijer",

year = "1999",

language = "Undefined/Unknown",

volume = "86",

pages = "1905--1912",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "AIP Publishing",

number = "4",

}