Diffraction stress analysis of thin films: modeling and experimental evaluation of elastic constants and grain interaction.

M van Leeuwen, J-D Kamminga, EJ Mittemeijer

    Research output: Contribution to journalArticleScientificpeer-review

    79 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)1905-1912
    Number of pages8
    JournalJournal of Applied Physics
    Volume86
    Issue number4
    Publication statusPublished - 1999

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