Direct correspondence between HEB current-voltage characteristics and the current-dependent resistive transition

R Barends, M Hajenius, JR Gao, TM Klapwijk

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 16th Int. Symposium on Space Terahertz Technology (ISSTT)
    EditorsJ et al Stake et al
    PublisherChalmers University of Technology
    Number of pages4
    Publication statusPublished - 2005

    Publication series

    PublisherChalmers University of Technology

    Bibliographical note

    niet opgevoerd in 2005


    • conference contrib. refereed
    • Conf.proc. > 3 pag

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