Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
Original languageUndefined/Unknown
Pages (from-to)293-297
Number of pages5
JournalSociety for Information Display. Journal
Volume17
Issue number3
Publication statusPublished - 2009

Keywords

  • CWTS JFIS < 0.75

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