Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

EJ Marinissen, B De Wachter, K Smith, J Kiesewetter, M Taouil, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 2014 IEEE International Test Conference
EditorsM Purtell, S Mitra
Place of PublicationWashington, DC, USA
PublisherITC & IEEE
Pages1-10
Number of pages10
ISBN (Print)978-1-4799-4722-5
DOIs
Publication statusPublished - 2014
EventITC 2014, Seattle, WA, USA - Washington, DC, USA
Duration: 21 Oct 201423 Oct 2014

Publication series

Name
PublisherITC & IEEE

Conference

ConferenceITC 2014, Seattle, WA, USA
Period21/10/1423/10/14

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