Directed assembly of nano particles with the help of charge patterns created with scanning electron microscope

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	803-805
Number of pages	3
Journal	Microelectronic Engineering
Volume	86
Issue number	4-6
Publication status	Published - 2009

Keywords

@article{32589e3f24924c66a3554c28cad8a872,

title = "Directed assembly of nano particles with the help of charge patterns created with scanning electron microscope",

keywords = "CWTS JFIS < 0.75",

author = "AC Zonnevylle and CW Hagen and P Kruit and A Schmidt-Ott",

year = "2009",

language = "Undefined/Unknown",

volume = "86",

pages = "803--805",

journal = "Microelectronic Engineering",

issn = "0167-9317",

publisher = "Elsevier",

number = "4-6",

}

TY - JOUR

T1 - Directed assembly of nano particles with the help of charge patterns created with scanning electron microscope

AU - Zonnevylle, AC

AU - Hagen, CW

AU - Kruit, P

AU - Schmidt-Ott, A

PY - 2009

Y1 - 2009

KW - CWTS JFIS < 0.75

M3 - Article

SN - 0167-9317

VL - 86

SP - 803

EP - 805

JO - Microelectronic Engineering

JF - Microelectronic Engineering

IS - 4-6

ER -