Dislocating analysis in GaN layers 195/1 and 195/2 using TEM

FD Tichelaar, HW Zandbergen, TR de Kruijff

    Research output: Book/Report › Report › Professional

    Original languageEnglish
    Place of Publications.l.
    Publishers.n.
    Number of pages9
    Publication statusPublished - 2001

    Publication series

    Name
    Publishers.n.

    Keywords

    • ZX Int.klas.verslagjaar < 2002

    Cite this