Dislocations in thin metal films observed with X-ray diffraction.

LJ Seijbel, R Delhez

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationConference proceedings Mat.Res.Soc.Proc.
    PagesP7.6.1-P7.6.6
    Publication statusPublished - 2001

    Publication series

    Name
    Name
    Volume673

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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