Does learning to reflect make better modelers

JH Slinger; JH Kwakkel; Maarten van der Niet

Does learning to reflect make better modelers

JH Slinger, JH Kwakkel, Maarten van der Niet

Policy Analysis

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 26th International Conference of the System Dynamics Society
Editors	Brian Dangerfield
Place of Publication	Athene
Publisher	System Dynamics Society
Pages	1-8
Number of pages	8
ISBN (Print)	978-1-935056-01-0
Publication status	Published - 2008
Event	International Conference of the System Dynamics Society 2008 - Athene, Griekenland, Cambridge, Massachusetts, United States Duration: 20 Jul 2008 → 24 Jul 2008 Conference number: 33

Publication series

Name
Publisher	System Dynamics Society

Conference

Conference	International Conference of the System Dynamics Society 2008
Country/Territory	United States
City	Cambridge, Massachusetts
Period	20/07/08 → 24/07/08

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

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title = "Does learning to reflect make better modelers",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "JH Slinger and JH Kwakkel and {van der Niet}, Maarten",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-1-935056-01-0",

publisher = "System Dynamics Society",

pages = "1--8",

editor = "{Brian Dangerfield}",

booktitle = "Proceedings of the 26th International Conference of the System Dynamics Society",

note = "International Conference of the System Dynamics Society 2008 ; Conference date: 20-07-2008 Through 24-07-2008",

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TY - GEN

T1 - Does learning to reflect make better modelers

AU - Slinger, JH

AU - Kwakkel, JH

AU - van der Niet, Maarten

N1 - Conference code: 33

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

UR - http://www.systemdynamics.org/conference/2008/proceed/index.html

M3 - Conference contribution

SN - 978-1-935056-01-0

SP - 1

EP - 8

BT - Proceedings of the 26th International Conference of the System Dynamics Society

A2 - Brian Dangerfield, null

PB - System Dynamics Society

CY - Athene

T2 - International Conference of the System Dynamics Society 2008

Y2 - 20 July 2008 through 24 July 2008

ER -

Does learning to reflect make better modelers

Publication series

Conference

Keywords

Other files and links

Cite this