DotFETs: MOSFETs strained by a single SiGe dot in a low-temperature ELA technology

C Biasotto

Research output: Thesis › Dissertation (TU Delft)

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Delft University of Technology
Supervisors/Advisors	Nanver, Lis, Supervisor
Award date	20 Oct 2011
Print ISBNs	978-90-8570-425-6
Publication status	Published - 2011

Keywords

@phdthesis{009dbe562f04459283e3e2355d059d5c,

title = "DotFETs: MOSFETs strained by a single SiGe dot in a low-temperature ELA technology",

keywords = "Diss. prom. aan TU Delft",

author = "C Biasotto",

year = "2011",

language = "English",

isbn = "978-90-8570-425-6",

type = "Dissertation (TU Delft)",

school = "Delft University of Technology",

}