Double-sided interferometer with low drift for stability testing.

JD Ellis, K Joo, JW Spronck, RH Munnig Schmidt

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings of the 9th International Symposium on Measurement Technology and Intelligent Instruments.
Editors s.n.
Place of PublicationSt.Petersburg, Russia
PublisherISMTII
Pages236-240
Number of pages5
Publication statusPublished - 2009
Event9th International Symposium on Measurement Technology and Intelligent Instruments, St. Petersburg, Russia - St.Petersburg, Russia
Duration: 29 Jun 20092 Jul 2009

Publication series

Name
PublisherISMTII

Conference

Conference9th International Symposium on Measurement Technology and Intelligent Instruments, St. Petersburg, Russia
Period29/06/092/07/09

Keywords

  • Conf.proc. > 3 pag

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