Down-scale problems of resonant SiC devices

R Kazinczi, JR Mollinger, A Bossche

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationMicro-Electro-Mechanical Systems (MEMS) 2000, vol. 2
Editors AP Lee
Place of PublicationNew York
PublisherASME
Pages221-225
Number of pages5
ISBN (Print)0-7918-1900-0
Publication statusPublished - 2000
Event2000 ASME International Mechanical Engineering Congress and Exposition, Orlando - New York
Duration: 5 Nov 200010 Nov 2000

Publication series

Name
PublisherASME

Conference

Conference2000 ASME International Mechanical Engineering Congress and Exposition, Orlando
Period5/11/0010/11/00

Keywords

  • ZX Int.klas.verslagjaar < 2002

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