DPM Reduction on dual-port caches

S Hamdioui, AJ van de Goor, M Rodgers

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationETW'02: 7th IEEE European Test Workshop; Informal Digest
PublisherIEEE Society
Pages55-60
Number of pages6
Publication statusPublished - 2002

Publication series

Name
PublisherIEEE

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag
  • ZX Int.klas.verslagjaar < 2002

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