DRAM Specific approximation of the faulty behavior of cell defects

Z Al-Ars, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the 11th Asian test symposium (ATS'02)
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages98-104
Number of pages7
ISBN (Print)0-7695-1825-7
Publication statusPublished - 2002
Event11th Asian test symposium - Piscataway, NJ, USA
Duration: 18 Nov 200220 Nov 2002

Publication series

Name
PublisherIEEE

Conference

Conference11th Asian test symposium
Period18/11/0220/11/02

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag
  • ZX Int.klas.verslagjaar < 2002

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