DRAM-specific space of memory tests

Z Al-Ars, S Hamdioui, AJ van de Goor, GN Gaydadjiev, J Vollrath

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationInternational Test Conference 2006
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-10
Number of pages10
ISBN (Print)1-4244-0292-1
Publication statusPublished - 2006
EventITC 2006 - Piscataway
Duration: 21 Oct 200626 Oct 2006

Publication series

Name
PublisherIEEE

Conference

ConferenceITC 2006
Period21/10/0626/10/06

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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