Drift-Diffusion-Reaction Model for Time-Domain Analysis of Charging Phenomena in Electron-Beam Irradiated Insulators

Behrouz Raftari Tangabi

Research output: ThesisDissertation (TU Delft)

29 Downloads (Pure)

Abstract

Electron microscopes take advantage of a beam of electrons to illuminate a
specimen and extract the needed information from the interaction of particles
with matter in order to produce a high resolution image. The main research
question of the present study arose from the fact that this resolution is degraded
when a given specimen contains insulating materials. In the electron
microscopy of insulators the effect behind the degradation of an image resolution
is known as the charging effect. The charging effect needs to be studied
and understood, in particular, since biological specimens are either insulators
or contain insulating parts.
Original languageEnglish
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Vuik, C., Supervisor
  • Budko, N.V., Advisor
Award date23 Oct 2018
Print ISBNs978-94-6186-960-9
DOIs
Publication statusPublished - 2018

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