Dual actuated nano-positioning for high speed atomic force microscopy

S Kuiper; G Schitter

Dual actuated nano-positioning for high speed atomic force microscopy

S Kuiper, G Schitter

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the 10th international conference of the European society for precision engineering and nanotechnology
Editors	H Spaan, P Shore
Place of Publication	Delft
Publisher	EUSPEN
Pages	225-228
Number of pages	4
ISBN (Print)	978-0-9553082-8-4
Publication status	Published - 2010
Event	10th international conference of the european society for precision engineering and nanotechnology - Delft Duration: 31 May 2010 → 4 Jun 2010

Publication series

Name
Publisher	Euspen

Name
Volume	1

Conference

Conference	10th international conference of the european society for precision engineering and nanotechnology
Period	31/05/10 → 4/06/10

Keywords

Conf.proc. > 3 pag

Cite this

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title = "Dual actuated nano-positioning for high speed atomic force microscopy",

keywords = "Conf.proc. > 3 pag",

author = "S Kuiper and G Schitter",

year = "2010",

language = "English",

isbn = "978-0-9553082-8-4",

publisher = "EUSPEN",

pages = "225--228",

editor = "H Spaan and P Shore",

booktitle = "Proceedings of the 10th international conference of the European society for precision engineering and nanotechnology",

note = "10th international conference of the european society for precision engineering and nanotechnology ; Conference date: 31-05-2010 Through 04-06-2010",

}

Kuiper, S & Schitter, G 2010, Dual actuated nano-positioning for high speed atomic force microscopy. in H Spaan & P Shore (eds), Proceedings of the 10th international conference of the European society for precision engineering and nanotechnology. EUSPEN, Delft, pp. 225-228, 10th international conference of the european society for precision engineering and nanotechnology, 31/05/10.

Dual actuated nano-positioning for high speed atomic force microscopy. / Kuiper, S; Schitter, G.
Proceedings of the 10th international conference of the European society for precision engineering and nanotechnology. ed. / H Spaan; P Shore. Delft: EUSPEN, 2010. p. 225-228.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Dual actuated nano-positioning for high speed atomic force microscopy

AU - Kuiper, S

AU - Schitter, G

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-0-9553082-8-4

SP - 225

EP - 228

BT - Proceedings of the 10th international conference of the European society for precision engineering and nanotechnology

A2 - Spaan, H

A2 - Shore, P

PB - EUSPEN

CY - Delft

T2 - 10th international conference of the european society for precision engineering and nanotechnology

Y2 - 31 May 2010 through 4 June 2010

ER -