Dynamic 3d mesh reconstruction based on nonrigid iterative closest-farthest points registration

Farzam Tajdari*, Felix Kwa, Christiaan Versteegh, Toon Huysmans, Yu Song

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)

Abstract

Fitting apparel and apparel in performing different activities is essential for the functional yet comfortable experience of the user. 4D scans, i.e. 3D scans in continuous timestamps, of the body (part) in performing those activities are the basis for the design of garments/apparel in 4D. In this paper, we proposed a semi-automatic workflow for constructing 4D scans of the body parts with the emphasis on registering noisy scans at a given timestamp. Continuous 3D scans regarding the moving body parts are captured first from different depth cameras from different view angles. In a given timestamp, the collected 3D scans are roughly aligned to a template using the rigid Iterative Closest Points (ICP) algorithm. Then these scans are further registered using a newly proposed non-rigid Iterative Closest-Farthest Points (ICFP) algorithm, in which correspondences between the source and the target are established by either closest or farthest points based on the newly defined logical distance concept and the probability theory. Experimental results indicated that the ICFP method is robust against noise and the scanning accuracy can be as high as 3.4 %. It also reveals that, for the human foot, the differences of ball width and ball angles between the loaded and the unloaded situation can be as large as 8 mm and 2 degrees, respectively. This highlights the importance of using 4D scan in designing garments and apparel.

Original languageEnglish
Title of host publication42nd Computers and Information in Engineering Conference (CIE)
PublisherThe American Society of Mechanical Engineers (ASME)
ISBN (Electronic)9780791886212
DOIs
Publication statusPublished - 2022
EventASME 2022 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC-CIE 2022 - St. Louis, United States
Duration: 14 Aug 202217 Aug 2022

Publication series

NameProceedings of the ASME Design Engineering Technical Conference
Volume2

Conference

ConferenceASME 2022 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC-CIE 2022
Country/TerritoryUnited States
CitySt. Louis
Period14/08/2217/08/22

Keywords

  • 4D scans
  • accuracy
  • logical distance
  • non-rigid Iterative Closest-Farthest Points (ICFP)
  • robust

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