Dynamic faults in random-access-memories: concept, fault models and tests

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	195-205
Number of pages	11
Journal	Journal of Electronic Testing: theory and applications
Volume	19
Issue number	2
Publication status	Published - 2003

Keywords

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