Mechanical strength of silicon solar wafers characterized by ring-on-ring test in combination with digital image correlation

V Popovich; W Geerstma; M Janssen; IJ Bennett; IM Richardson

doi:10.1002/9781119093503.ch28

Mechanical strength of silicon solar wafers characterized by ring-on-ring test in combination with digital image correlation

V Popovich, W Geerstma, M Janssen, IJ Bennett, IM Richardson

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Original language	English
Title of host publication	Proceedings EPD Congress 2015-TMS 2015
Editors	JA Yurko, P Tripathy, S Ikhmayies, et al.
Place of Publication	Hoboken, NJ, USA
Publisher	John Wiley & Sons
Pages	241-248
ISBN (Print)	978-1-119-08245-3
DOIs	https://doi.org/10.1002/9781119093503.ch28
Publication status	Published - 2015
Event	EPD Congress 2015-TMS 2015, Orlando, USA - Hoboken, NJ, USA Duration: 15 Mar 2015 → 19 Mar 2015

Publication series

Name
Publisher	John Wiley & Sons

Conference

Conference	EPD Congress 2015-TMS 2015, Orlando, USA
Period	15/03/15 → 19/03/15

Bibliographical note

Harvest

Access to Document

10.1002/9781119093503.ch28

Cite this

Popovich, V., Geerstma, W., Janssen, M., Bennett, IJ., & Richardson, IM. (2015). Mechanical strength of silicon solar wafers characterized by ring-on-ring test in combination with digital image correlation. In JA. Yurko, P. Tripathy, S. Ikhmayies, & et al. (Eds.), Proceedings EPD Congress 2015-TMS 2015 (pp. 241-248). John Wiley & Sons. https://doi.org/10.1002/9781119093503.ch28

@inproceedings{e933dca0e0cd4644b4c4d7a8bafd10e4,

title = "Mechanical strength of silicon solar wafers characterized by ring-on-ring test in combination with digital image correlation",

author = "V Popovich and W Geerstma and M Janssen and IJ Bennett and IM Richardson",

note = "Harvest; EPD Congress 2015-TMS 2015, Orlando, USA ; Conference date: 15-03-2015 Through 19-03-2015",

year = "2015",

doi = "10.1002/9781119093503.ch28",

language = "English",

isbn = "978-1-119-08245-3",

publisher = "John Wiley & Sons",

pages = "241--248",

editor = "JA Yurko and P Tripathy and S Ikhmayies and {et al.}",

booktitle = "Proceedings EPD Congress 2015-TMS 2015",

}

Popovich, V, Geerstma, W, Janssen, M, Bennett, IJ & Richardson, IM 2015, Mechanical strength of silicon solar wafers characterized by ring-on-ring test in combination with digital image correlation. in JA Yurko, P Tripathy, S Ikhmayies & et al. (eds), Proceedings EPD Congress 2015-TMS 2015. John Wiley & Sons, Hoboken, NJ, USA, pp. 241-248, EPD Congress 2015-TMS 2015, Orlando, USA, 15/03/15. https://doi.org/10.1002/9781119093503.ch28

Mechanical strength of silicon solar wafers characterized by ring-on-ring test in combination with digital image correlation. / Popovich, V; Geerstma, W; Janssen, M et al.
Proceedings EPD Congress 2015-TMS 2015. ed. / JA Yurko; P Tripathy; S Ikhmayies; et al. Hoboken, NJ, USA: John Wiley & Sons, 2015. p. 241-248.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Mechanical strength of silicon solar wafers characterized by ring-on-ring test in combination with digital image correlation

AU - Popovich, V

AU - Geerstma, W

AU - Janssen, M

AU - Bennett, IJ

AU - Richardson, IM

N1 - Harvest

PY - 2015

Y1 - 2015

U2 - 10.1002/9781119093503.ch28

DO - 10.1002/9781119093503.ch28

M3 - Conference contribution

SN - 978-1-119-08245-3

SP - 241

EP - 248

BT - Proceedings EPD Congress 2015-TMS 2015

A2 - Yurko, JA

A2 - Tripathy, P

A2 - Ikhmayies, S

A2 - et al., null

PB - John Wiley & Sons

CY - Hoboken, NJ, USA

T2 - EPD Congress 2015-TMS 2015, Orlando, USA

Y2 - 15 March 2015 through 19 March 2015

ER -