ECC design for fault-tolerant crossbar memories: a case study

NZB Haron, S Hamdioui, Z Ahyadi

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publication5th Intl. design and test workshop
EditorsI Elahi, A Ivanov, Y Zorian, A Salem
Place of PublicationPiscataway
PublisherIEEE Society
Pages61-666
Number of pages606
Publication statusPublished - 2010
EventIDT'10 - Piscataway
Duration: 14 Dec 201015 Dec 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceIDT'10
Period14/12/1015/12/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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