Original language | Undefined/Unknown |
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Pages (from-to) | 183-195 |
Number of pages | 13 |
Journal | Ultramicroscopy |
Volume | 75 |
Issue number | 3 |
Publication status | Published - 1998 |
Effect of electron beam parameters on CBED patterns from interfaces.
Regina Bokel, FW Schapink, FD Tichelaar
Research output: Contribution to journal › Article › Scientific › peer-review
3
Citations
(Scopus)