Effect of electron beam parameters on CBED patterns from interfaces.

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)183-195
    Number of pages13
    JournalUltramicroscopy
    Volume75
    Issue number3
    Publication statusPublished - 1998

    Cite this