| Original language | Undefined/Unknown |
|---|---|
| Pages (from-to) | 183-195 |
| Number of pages | 13 |
| Journal | Ultramicroscopy |
| Volume | 75 |
| Issue number | 3 |
| Publication status | Published - 1998 |
Effect of electron beam parameters on CBED patterns from interfaces.
Regina Bokel, FW Schapink, FD Tichelaar
Research output: Contribution to journal › Article › Scientific › peer-review
3
Citations
(Scopus)