Effect of metal layout design on passivation crack occurrence using both experimental and simulation techniques

RBR van Silfhout, WD van Driel, Y. Li, MAJ van Gils, JHJ Jansen, GQ Zhang, G Tao, J Bisschop, LJ Ernst

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

8 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationEuroSimE 2004: 5th international conference on thermal and mechanical simulation and experiments in microelectronics and microsystems
EditorsLJ Ernst, GQ Zhang, P Rodgers, O de Saint Leger
Place of PublicationPiscataway
PublisherIEEE Society
Pages69-74
Number of pages6
ISBN (Print)0-7803-8420-2
Publication statusPublished - 2004
EventEuroSimE 2004: 5th international conference on thermal and mechanical simulation and experiments in microelectronics and microsystems - Brussels, Belgium
Duration: 10 May 200412 May 2004

Publication series

Name
PublisherIEEE

Conference

ConferenceEuroSimE 2004: 5th international conference on thermal and mechanical simulation and experiments in microelectronics and microsystems
CountryBelgium
CityBrussels
Period10/05/0412/05/04

Keywords

  • Conf.proc. > 3 pag

Cite this