Effect of pressure on nano copper sintering in interconnections of power device

Jing Qian, Xianping Chen, Chunjian Tan, Xiandong Li, Qiumei Li, Luqi Tao, Yiping Huang, Lingmei Wu

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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Abstract

As the next-generation solder, nano-copper paste has attracted wide attention in the field of power electronics due to its outstanding properties. In this paper, the effect of pressure on nano-copper sintering is investigated. It is found that the electrode of chip cannot be contacted to the nano-copper layer when no pressure is applied, whereas during the sintering there are fewer defects on the surface of nano-copper compared with that of pre-sintering under certain pressure conditions. Besides, the results of metallographic microscope confirm that the sintering quality of nano-copper has a positive relationship with pressure.

Original languageEnglish
Title of host publication2019 20th International Conference on Electronic Packaging Technology, ICEPT 2019
PublisherIEEE
Number of pages4
ISBN (Electronic)9781728150642
DOIs
Publication statusPublished - 2019
Event20th International Conference on Electronic Packaging Technology, ICEPT 2019 - Hong Kong, China
Duration: 12 Aug 201915 Aug 2019

Publication series

Name2019 20th International Conference on Electronic Packaging Technology, ICEPT 2019

Conference

Conference20th International Conference on Electronic Packaging Technology, ICEPT 2019
Country/TerritoryChina
CityHong Kong
Period12/08/1915/08/19

Keywords

  • Nano-copper
  • Power electronics
  • Pressure
  • Sintering

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