Effects of grain-boundaries in excimer-laser crystallized poly-Si thin-film transistors

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

3 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings ESSDERC 2001
Editors H Ryssel, G Wachutka, H Grünbacher
Place of PublicationS.l.
PublisherFrontier Group
Pages479-482
Number of pages4
ISBN (Print)2-914601-01-8
Publication statusPublished - 2001
Event31th European Solid-State Device Research Conference, Nuremberg, Ger - S.l.
Duration: 11 Sep 200113 Sep 2001

Publication series

Name
PublisherFrontier Group

Conference

Conference31th European Solid-State Device Research Conference, Nuremberg, Ger
Period11/09/0113/09/01

Keywords

  • ZX Int.klas.verslagjaar < 2002

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