Effects of grain-boundaries in excimer-laser crystallized poly-Si thin-film transistors

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings ESSDERC 2001
Editors	H Ryssel, G Wachutka, H Grünbacher
Place of Publication	S.l.
Publisher	Frontier Group
Pages	479-482
Number of pages	4
ISBN (Print)	2-914601-01-8
Publication status	Published - 2001
Event	31th European Solid-State Device Research Conference, Nuremberg, Ger - S.l. Duration: 11 Sept 2001 → 13 Sept 2001

Name
Publisher	Frontier Group

Conference	31th European Solid-State Device Research Conference, Nuremberg, Ger
Period	11/09/01 → 13/09/01

Keywords

@inproceedings{c36e53ba8b8a42e38117a9a36e5b46e1,

title = "Effects of grain-boundaries in excimer-laser crystallized poly-Si thin-film transistors",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "R Ishihara",

year = "2001",

language = "Undefined/Unknown",

isbn = "2-914601-01-8",

publisher = "Frontier Group",

pages = "479--482",

editor = "{H Ryssel} and {G Wachutka} and {H Gr{\"u}nbacher}",

booktitle = "Proceedings ESSDERC 2001",

note = "31th European Solid-State Device Research Conference, Nuremberg, Ger ; Conference date: 11-09-2001 Through 13-09-2001",

}

TY - GEN

T1 - Effects of grain-boundaries in excimer-laser crystallized poly-Si thin-film transistors

AU - Ishihara, R

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 2-914601-01-8

SP - 479

EP - 482

BT - Proceedings ESSDERC 2001

A2 - H Ryssel, null

A2 - G Wachutka, null

A2 - H Grünbacher, null

PB - Frontier Group

CY - S.l.

T2 - 31th European Solid-State Device Research Conference, Nuremberg, Ger

Y2 - 11 September 2001 through 13 September 2001

ER -