Original language | English |
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Pages (from-to) | 1279-1284 |
Number of pages | 6 |
Journal | Microelectronics Reliability |
Volume | 52 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2012 |
Bibliographical note
harvestBetreft: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2011), Linz, Austria