Effects of single vacancy defect position on the stability of carbon nanotubes

RH Poelma, H Sadeghian Marnani, SW Koh, GQ Zhang

Research output: Contribution to journalArticleScientificpeer-review

32 Citations (Scopus)
Original languageEnglish
Pages (from-to)1279-1284
Number of pages6
JournalMicroelectronics Reliability
Volume52
Issue number7
DOIs
Publication statusPublished - 2012

Bibliographical note

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Betreft: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2011), Linz, Austria

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