Effects of single vacancy defect position on the stability of carbon nanotubes

RH Poelma; H Sadeghian Marnani; SW Koh; GQ Zhang

doi:10.1016/j.microrel.2012.03.015

Effects of single vacancy defect position on the stability of carbon nanotubes

RH Poelma, H Sadeghian Marnani, SW Koh, GQ Zhang

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	1279-1284
Number of pages	6
Journal	Microelectronics Reliability
Volume	52
Issue number	7
DOIs	https://doi.org/10.1016/j.microrel.2012.03.015
Publication status	Published - 2012

Bibliographical note

harvest
Betreft: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2011), Linz, Austria

Access to Document

10.1016/j.microrel.2012.03.015

Cite this

@article{41a60e2aa005465c8ea1ac98aeb70bd7,

title = "Effects of single vacancy defect position on the stability of carbon nanotubes",

author = "RH Poelma and {Sadeghian Marnani}, H and SW Koh and GQ Zhang",

note = "harvest Betreft: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2011), Linz, Austria",

year = "2012",

doi = "10.1016/j.microrel.2012.03.015",

language = "English",

volume = "52",

pages = "1279--1284",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "7",

}

TY - JOUR

T1 - Effects of single vacancy defect position on the stability of carbon nanotubes

AU - Poelma, RH

AU - Sadeghian Marnani, H

AU - Koh, SW

AU - Zhang, GQ

N1 - harvest Betreft: 12th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2011), Linz, Austria

PY - 2012

Y1 - 2012

U2 - 10.1016/j.microrel.2012.03.015

DO - 10.1016/j.microrel.2012.03.015

M3 - Article

SN - 0026-2714

VL - 52

SP - 1279

EP - 1284

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 7

ER -